The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Apr. 10, 2007
Sipke Wadman, Eindhoven, NL;
Sipke Wadman, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An optical measurement device for measuring an optical appearance of a surface of a sample, in particular the surface of a human skin, wherein the optical measurement device comprises: a first illumination device () for illuminating the surface () with a first illumination beam (), wherein the first illumination beam () is incident at a first angle of incidence () onto the surface (); and a detection device () for detecting a response beam (), wherein the response beam () is a response of the sample () to the first illumination beam (), comprising at least one screen () for intercepting the response beam () and at least an image detection component (). The optical measurement device () comprises a second illumination device (), wherein the second illumination device () is providing a second illumination beam () with a second angle of incidence () at the surface (), wherein the first angle of incidence () is different from the second angle of incidence ().