The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Nov. 22, 2006
Marc Frankinet, Horion-Hozemont, BE;
Marc Frankinet, Horion-Hozemont, BE;
Schreder, Brussels, BE;
Abstract
A method for establishing light reflection properties of a specific surface, by measuring, for a plurality of comparison surfaces, the r-tables in accordance with CIE standard recommendations, measuring, for the same plurality of comparison surfaces, a light reflection parameter for selected angles (γ) of incident light and angles (90°−α) and (β) of reflected light, using a 'portable' measuring apparatus, measuring in situ, on multiple measuring points of said specific surface, said parameter for said angles (γ), (α) and (β), using said 'portable' apparatus, comparing the angular distribution of said parameter for the specific surface with that for said comparison surfaces, to select the comparison surface showing the best distribution fit, optionally taking into account a rescaling factor on luminance coefficient Q, and assigning to said specific surface the ‘r-table’ corresponding to said selected comparison surface, with said optional rescaling factor.