The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2011

Filed:

Dec. 27, 2006
Applicants:

Moon-il Jung, Suwon-si, KR;

Jong-chul Choi, Suwon-si, KR;

Taek-seong Jeong, Suwon-si, KR;

Inventors:

Moon-il Jung, Suwon-si, KR;

Jong-chul Choi, Suwon-si, KR;

Taek-seong Jeong, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical recording medium in which interference patterns formed from interference between signal light and reference light are recorded as data and a recording/reproducing method and apparatus for the optical recording medium. The optical recording medium including at least a recording layer in which predetermined data is recorded, wherein a thickness of a portion of the recording layer is larger than a thickness of another portion of the recording layer, wherein data is recorded in the thicker region, and the additional information of a recording condition and/or a reproducing condition is recorded in the thinner region.


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