The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Feb. 28, 2008
Katsumi Homma, Kawasaki, JP;
Izumi Nitta, Kawasaki, JP;
Toshiyuki Shibuya, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
Within-die delay distributions and die-to-die delay distributions of two arbitrary paths in an analysis target circuit are extracted from a delay distribution library, and an effect index indicative of a relative error of an overall path delay distribution of one path and an overall path delay distribution when the two paths are integrated as one path is calculated based on the within-die delay distributions and the die-to-die delay distributions of the two paths. When the effect index is determined to be equal to or above a threshold, the overall path delay distribution of the two paths integrated as one path is calculated. Hence, a path that affects an analysis result alone is selected to execute a statistical Max operation, thereby increasing a speed of delay analysis processing.