The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Sep. 07, 2006
Laurent Souef, Montauroux, FR;
Didier Gayraud, Nice, FR;
Laurent Souef, Montauroux, FR;
Didier Gayraud, Nice, FR;
NXP B.V., Eindhoven, NL;
Abstract
A method of testing an integrated circuit, comprises providing a test vector to a shift register arrangement by providing test vector bits in series into the shift register arrangement () timed with a first, scan, clock signal (). The test vector bits are passed between adjacent portions of the shift register arrangement timed with the first clock signal () and an output response of the integrated circuit to the test vector is provided and analyzed. The output response of the integrated circuit to the test vector is provided under the control of a second clock signal () which is slower than the first clock signal. This testing method speeds up the process by increasing the speed of shifting test vectors and results into and out of the shift register, but without comprising the stability of the testing process. Furthermore, the method can be implemented without requiring additional complexity of the testing circuitry to be integrated onto the circuit substrate.