The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7869719 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 11, 2011

Filed:

Mar. 11, 2009
Applicants:

Takeshi Hoshida, Richardson, TX (US);

Seemant Choudhary, Bangalore, IN;

Inventors:

Takeshi Hoshida, Richardson, TX (US);

Seemant Choudhary, Bangalore, IN;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/06 (2006.01); H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for receiving an optical signal is included where an ingress signal is split into a first portion and a second portion. A relative delay is induced between the first portion and the second portion, which are optically interfered to generate at least one interfered signal. Quality criteria of a monitored signal at least based on the at least one interfered signal is monitored so that a relative delay based in the quality criteria may be adjusted.


Find Patent Forward Citations

Hoshida, Takeshi. (2011). Method and system for automatic feedback control for fine tuning a delay interferometer (U.S. Patent No. 7869719). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7869719

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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