The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2011

Filed:

Oct. 18, 2006
Applicants:

Philip Nan Ji, Princeton, NJ (US);

Ting Wang, Princeton, NJ (US);

Arthur Dogariu, Hamilton, NJ (US);

Lei Zhong, Plainsboro, NJ (US);

Osamu Matsuda, Chiba, JP;

Yuji Abe, Tokyo, JP;

Inventors:

Philip Nan Ji, Princeton, NJ (US);

Ting Wang, Princeton, NJ (US);

Arthur Dogariu, Hamilton, NJ (US);

Lei Zhong, Plainsboro, NJ (US);

Osamu Matsuda, Chiba, JP;

Yuji Abe, Tokyo, JP;

Assignees:

NEC Laboratories America, Inc., Princeton, NJ (US);

NEC Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tunable asymmetric interleaver constructed from two symmetric interleavers in series, wherein either or both of the individual symmetric interleavers exhibit a wavelength shifting ability. Advantageously, tunable asymmetric interleavers so constructed provide continuous tunable interleaving ratios from 0:100 to 50:50 to 100:0 and provide attractive upgrade paths for existing and future DWDM networks and applications.


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