The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Nov. 26, 2008
Jiang Hsieh, Brookfield, WI (US);
Eugne Lino Saragnese, Delafield, WI (US);
J. Eric Stahre, Oconomowoc, WI (US);
Bijan Dorri, Waukesha, WI (US);
James Kaufman, Milwaukee, WI (US);
Robert Franklin Senzig, Germantown, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Eugne Lino Saragnese, Delafield, WI (US);
J. Eric Stahre, Oconomowoc, WI (US);
Bijan Dorri, Waukesha, WI (US);
James Kaufman, Milwaukee, WI (US);
Robert Franklin Senzig, Germantown, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods and apparatus for x-ray imaging with focal spot deflection are provided. The apparatus includes an x-ray tube having a cathode configured to emit electrons and an anode having a target with a target surface defining a target angle. The emitted electrons are deflected onto the target surface with the target surface substantially aligned with a z-axis parallel to a gantry rotation axis.