The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2011

Filed:

Oct. 19, 2006
Applicants:

Abdelaziz Ikhlef, Versailles, FR;

Charles Hugh Shaughnessy, Whitefish Bay, WI (US);

Inventors:

Abdelaziz Ikhlef, Versailles, FR;

Charles Hugh Shaughnessy, Whitefish Bay, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes performing an x-ray focal spot deflection to generate two complete projections from two different channels of an x-ray detector, wherein the channels are purposefully different from each other in some respect other than being different channels.


Find Patent Forward Citations

Ikhlef, Abdelaziz. (2011). X-ray detector methods and apparatus (U.S. Patent No. 7869559). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7869559

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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