The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Jan. 03, 2008
Michael A. Sorna, Hopewell Junction, NY (US);
William R. Kelly, Verbank, NY (US);
Daniel W. Storaska, Walden, NY (US);
Michael A. Sorna, Hopewell Junction, NY (US);
William R. Kelly, Verbank, NY (US);
Daniel W. Storaska, Walden, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An eyewidth of a data signal is determined by steps including: (a) recovering a phase of a clock from a data signal as a sampling clock; (b) shifting the phase of the sampling clock away from the first phase by a count multiplied by predetermined phase amount; (c) sampling the data signal with the shifted sampling clock phase to obtain sample data; d) determining whether the sample data contains error; (e) when the sample data does not contain error, recovering the phase of the clock from the data signal again for use as the first phase of the sampling clock, increasing the count value and repeating steps (b) through (e); and f) when the sample data contains error, determining the eyewidth based on the last shifted phase of the sampling clock prior to determining that the sample data contains error.