The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2011

Filed:

May. 21, 2009
Applicant:

Hirokazu Kubo, Hino, JP;

Inventor:

Hirokazu Kubo, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02F 1/33 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object to perform high-precision observation by compensating group-velocity-delay dispersion and angular dispersion with a simple structure. The invention provides a laser microscopeincluding a light source; an acousto-optic deflectorthat deflects ultrashort-pulse laser light L emitted from the light source; an angular-dispersion elementdisposed in front of or after the acousto-optic deflectorthat applies angular dispersion in a direction opposite to the acousto-optic deflectorand a group-velocity-delay dispersion-amount adjusting unitthat adjusts the amount of dispersion compensation by moving the angular-dispersion elementso as to vary the optical path length at each wavelength between the angular-dispersion elementand the acousto-optic deflector


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