The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Sep. 14, 2006
Kentaro Sato, Fukuyama, JP;
Takanobu Saito, Chiba, JP;
Takashi Iwama, Fukuyama, JP;
Akihide Yoshitake, Chiba, JP;
Mitsuaki Uesugi, Kawasaki, JP;
Kentaro Sato, Fukuyama, JP;
Takanobu Saito, Chiba, JP;
Takashi Iwama, Fukuyama, JP;
Akihide Yoshitake, Chiba, JP;
Mitsuaki Uesugi, Kawasaki, JP;
JFE Steel Corporation, Tokyo, JP;
JFE Techno-Research Corporation, Tokyo, JP;
Abstract
A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying meanscapable of switching and displaying a plurality of kinds of light-and-shade patterns, capturing meansfor capturing mirror images, reflected in the specular or semi-specular surface of a measurement target, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating meansfor performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.