The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2011

Filed:

Jul. 17, 2008
Applicants:

Takuji Kurozumi, Kyoto, JP;

Yoshiaki Togawa, Kyoto, JP;

Inventors:

Takuji Kurozumi, Kyoto, JP;

Yoshiaki Togawa, Kyoto, JP;

Assignee:

Horiba, Ltd., , JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention may measure the sprayed particle sprayed from the nozzle safely with the use of a conventional particle size distribution measuring device The particle size distribution measuring device may measure particle size distribution of a particle group, and may include a device body comprising a light source that irradiates light on the particle group and a light detector that detects intensity of diffracted light or/and scattered light generated by irradiation of the light, a spray measuring system that introduces a sprayed particle group as being the particle group sprayed from a nozzle into a measuring area between the light source and the light detector, and an ordinary measuring system that arranges a measuring cell that accommodates an ordinary particle group as being a particle group other than the sprayed particle group between the light source and the light detector are arranged to be exchangeable for each other.


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