The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Dec. 21, 2007
Jesse R. Boyer, Berlin, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Randall W. Joyner, Union, CT (US);
Joseph D Drescher, Middletown, CT (US);
Jesse R. Boyer, Berlin, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Randall W. Joyner, Union, CT (US);
Joseph D Drescher, Middletown, CT (US);
United Technologies Corp., Hartford, CT (US);
Abstract
A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.