The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Feb. 07, 2008
Alireza Shirvani-mahdavi, San Jose, CA (US);
George Chien, Cupertino, CA (US);
Alireza Shirvani-Mahdavi, San Jose, CA (US);
George Chien, Cupertino, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Methods and apparatus are provided for performing loopback testing of integrated circuits ('ICs'). In an embodiment of the invention, an IC can be tested on an undiced wafer by coupling a wireless transmitter of the IC to a wireless receiver of the IC. Core circuitry of the IC can be controlled to cause the transmitter to send at least one signal to the receiver. Upon receipt of the at least one signal, the receiver can send a signal to the core circuitry, which can determine, and possibly record, whether the transmission and receipt were successful. The invention advantageously facilitates efficient testing of unpackaged ICs at the wafer level.