The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Apr. 11, 2002
Applicants:
Konomu Hirao, Kyoto, JP;
Yasuhito Murata, Kyoto, JP;
Inventors:
Konomu Hirao, Kyoto, JP;
Yasuhito Murata, Kyoto, JP;
Assignee:
ARKRAY, Inc., Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample analysis device is provided in which a target component to be analyzed is prevented from being contaminated by a sample itself, which can be formed in an appropriate size, and which has excellent operability. In a sample analysis devicein which a sample is to be held in a porous sheet, supporting filmsandare stuck on front and rear faces of the porous sheet, respectively, and a sample supply holeis formed in a part of the supporting films.