The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Aug. 19, 2008
Stephen John Sleijpen, Balmain, AU;
William John Stacey, Balmain, AU;
Julian Paul Kolodko, Balmain, AU;
Neil Fyfe Edwards, Balmain, AU;
Neil Mcalpin, Balmain, AU;
Eric Patrick O'donnell, Balmain, AU;
John Robert Sheahan, Balmain, AU;
Jason Mark Thelander, Balmain, AU;
Stephen John Sleijpen, Balmain, AU;
William John Stacey, Balmain, AU;
Julian Paul Kolodko, Balmain, AU;
Neil Fyfe Edwards, Balmain, AU;
Neil McAlpin, Balmain, AU;
Eric Patrick O'Donnell, Balmain, AU;
John Robert Sheahan, Balmain, AU;
Jason Mark Thelander, Balmain, AU;
Silverbrook Research Pty Ltd, Balmain, New South Wales, AU;
Abstract
The invention provides for a diagnostic probe assembly for a tester which is used to diagnose printhead integrated circuits. The probe assembly includes a support assembly and a controller board mounted on the support assembly and having a processor configured to generate test signals for testing a printhead integrated circuit. A routing board is in operative signal communication with the controller board and is configured to multiplex the generated test signals for respective dies of the printhead integrated circuits. The probe assembly also includes a probe interface in signal communication with the routing board and configured for relaying the multiplexed test signals to and from the respective dies.