The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2011
Filed:
Nov. 15, 2006
Scott Lee Adriaansen, Elmira, NY (US);
Jianhua LI, Corning, NY (US);
Creighton J Miller, Burdett, NY (US);
Paul Maynard Schermerhorn, Painted Post, NY (US);
Scott Lee Adriaansen, Elmira, NY (US);
Jianhua Li, Corning, NY (US);
Creighton J Miller, Burdett, NY (US);
Paul Maynard Schermerhorn, Painted Post, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Systems, methods and apparatus relate to handling and processing glass, such as glass for use in liquid crystal displays, involving a measurement device, such as a distortion gauge, residing in an environmentally controlled measurement room, and a cassette loading device for storage and conveyance of glass between the measurement device and other components of a glass handling and processing system residing with the cassette loading device in a preparation room. A mail-slot opening may be present in a wall separating the measurement room from the preparation room. A gauge conveyor may convey glass between the cassette loading device and the measurement device. A distortion gauge may measure a reference value of the product glass with respect to reference marks on a glass reference plate of the distortion gauge. Other examples of a measurement device include a warp gauge, a stress gauge, a thickness gauge, and a compaction gauge.