The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Jul. 26, 2005
Srimanth Gunturi, Raleigh, NC (US);
Richard L. Kulp, Cary, NC (US);
Gili Mendel, Cary, NC (US);
Rebecca J. Schaller, Cary, NC (US);
Peter A. Walker, Fuquay-Varina, NC (US);
Joseph R. Winchester, Otterbourne, GB;
Srimanth Gunturi, Raleigh, NC (US);
Richard L. Kulp, Cary, NC (US);
Gili Mendel, Cary, NC (US);
Rebecca J. Schaller, Cary, NC (US);
Peter A. Walker, Fuquay-Varina, NC (US);
Joseph R. Winchester, Otterbourne, GB;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The invention is directed to a method which derives from metadata definitions the allowable values for a method argument, where the allowable values are a subset or a restricted set of values from a defined range of values for that type of method argument. The subset of allowable values is then converted into a fragment of source code that can be used to initialize the argument variable with one of the allowable values when the method is invoked. The fragment of source code is inserted into the source code for that method argument using an editor tool. A system for implementing the method may comprise an integrated development environment (IDE) program.