The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Feb. 16, 2007
Applicants:

Ming-luen Liou, Taipei County, TW;

Rong-liang Chiou, Hsinchu, TW;

Inventors:

Ming-Luen Liou, Taipei County, TW;

Rong-Liang Chiou, Hsinchu, TW;

Assignee:

Mediatek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/35 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for generating a detected punctured position in punctured convolutional codes. A delay line circuit has a plurality of delay elements connected in series, storing a finite sequence of an input bit stream. A logic gate circuit, coupled to outputs of a part of the delay elements of the delay line circuit in accordance with a parity check polynomial, performs a logic operation to output a number stream. The number stream is accumulated for possible punctured positions and the one of the possible punctured positions with a minimal accumulated number is selected and determined as the detected punctured position.


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