The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Jul. 26, 2006
Applicants:
Tony X. Han, Urbana, IL (US);
Visvanathan Ramesh, Plainsboro, NJ (US);
Ying Zhu, Monmouth Junction, NJ (US);
Inventors:
Tony X. Han, Urbana, IL (US);
Visvanathan Ramesh, Plainsboro, NJ (US);
Ying Zhu, Monmouth Junction, NJ (US);
Assignee:
Siemens Corporation, Iselin, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract
The performance of template matching is characterized by deriving the distribution of warp parameter estimate as a function of the ideal template, the ideal warp parameters and a given perturbation or noise model. An expression for the Probability Mass Function of the parameter estimate is provided. The optimal template size for template matching is the one that provides the best matching performance which is calculated from the minimum entropy of the parameter estimate.