The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Oct. 30, 2006
Tatsuki Yamada, Tokyo, JP;
Tatsuki Yamada, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
It is possible to provide a microscope system, capable of constructing a wide vision and high definition microscope image without requiring a work by a pathologist, of reducing a storage capacity for recording and storing after a pathologist observing and/or determining a diagnosis, and of forming and displaying a wide vision and high definition microscope image by comprising means for obtaining image information of the entirety, or a part, of a sample by moving an object lens and a sample relatively to each other in the perpendicular direction against an optical axis, means for designating a specific zone of the obtained image information, means for storing image information of the designated specific zone, means for reducing an information volume of image information not designated among the obtained image information, means for storing the reduced image information, and means for storing a positional relationship between these pieces of stored image information.