The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

May. 19, 2010
Applicants:

Chih-ming Hung, McKinney, TX (US);

Charvaka Duvvury, Plano, TX (US);

Inventors:

Chih-Ming Hung, McKinney, TX (US);

Charvaka Duvvury, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ESD protection circuit () is guarded by a parallel first precharge elimination circuit () relative to an I/O pad () and a parallel second precharge elimination circuit () relative to a VDD pad (). The precharge elimination circuits are synchronized with the ESD protection circuit to eliminate any precharge voltage to ground before an ESD pulse affects the I/O pad or VDD pad. A diode () is connected between I/O pad and VDD. Circuit () is between I/O pad and ground () and is powered by the same VDD. Circuit () includes a first resistor (), a first nMOS transistor (), and a first RC timer including a second resistor () and a first capacitor (). Circuit () includes a third resistor (), a second nMOS transistor (), and a second RC timer including a fourth resistor () and a second capacitor ().


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Hung, Chih-Ming. (2011). Methodology to guard esd protection circuits against precharge effects (U.S. Patent No. 7864494). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7864494

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