The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Mar. 24, 2009
Ichiro Sase, Yokohama, JP;
Shuji Toyoda, Chigasaki, JP;
Ichiro Sase, Yokohama, JP;
Shuji Toyoda, Chigasaki, JP;
Nikon Corporation, Tokyo, JP;
Abstract
Providing a microscope capable of movably adjusting an observation field of a sample without moving the sample. The microscope includes a first objective lens, a second objective lens, a mirror, an angular adjustment mechanism, and a shift mechanism. The first objective lens is disposed to the sample side. The second objective lens forms an intermediate image of the sample together with the first objective lens. The mirror is disposed with a tilt on an optical path between the first objective lens and the second objective lens. The angular adjustment mechanism rotatably adjust the mirror in the tilt direction. The shift mechanism makes a shift adjustment of the second objective lens in an axial direction of a rotation axis of the mirror. With the configuration, the observation field can be moved two-dimensionally by the angular adjustment mechanism.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile