The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Nov. 16, 2007
Applicants:

Kensuke Terakawa, Ashigarakami-gun, JP;

Wataru Ito, Ashigarakami-gun, JP;

Inventors:

Kensuke Terakawa, Ashigarakami-gun, JP;

Wataru Ito, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Deterioration of the resolution of tomographic images obtained by optical tomography measurement is prevented. Interference signals, which are obtained when a light beam L is emitted, are divided into a plurality of divided interference signals each having different wavelength bands. Spectral analysis is administered for each of the plurality of divided interference signals, to obtain a plurality of pieces of intermediate tomographic data. The plurality of pieces of intermediate tomographic data are employed to obtain tomographic data, a tomographic image is generated based on the tomographic data, then displayed.


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