The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Jul. 20, 2007
Ronny Bockstaele, Merelbeke, BE;
Bert Luyssaert, Ghent, BE;
Kris Naessens, Melle, BE;
Trinean NV, Gentbrugge, BE;
Abstract
An optical characterisation system is described for characterising optical material. The system typically comprises a diffractive element (), a detector () and an optical element (). The optical element () thereby typically is adapted for receiving an illumination beam, which may be an illumination response of the material. The optical element () typically has a refractive surface for refractively collimating the illumination beam on the diffractive element () and a reflective surface for reflecting the diffracted illumination beam on the detector (). The optical element () furthermore is adapted for cooperating with the diffractive element () and the detector () being positioned at a same side of the optical element () opposite to the receiving side for receiving the illumination beam.