The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Dec. 09, 2005
Applicants:

Paul Benz, Diepoldsau, CH;

Jürg Hinderling, Marbach, CH;

Martin De-lange, Kesswil, CH;

Inventors:

Paul Benz, Diepoldsau, CH;

Jürg Hinderling, Marbach, CH;

Martin De-Lange, Kesswil, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the invention, the sensitivity of a method for electronic measurement may be improved, carried out by the principle of heterodyne reception with the steps of broadcast of pulsed electromagnetic radiation (ES) with at least one pulse repetition frequency, reception of back-scattered radiation (RS), whereby the back-scattered radiation (RS) is converted into a received signal, mixing of the received signals, determination of at least one time parameter from the at least one output signal, whereby on mixing the received signals at least two pulsed mixed signals are mixed to give at least two output signals and the at least two mixed signals are phase-shifted relative to each other.


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