The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Jul. 30, 2007
Applicant:
Norio Sugita, Yokohama, JP;
Inventor:
Norio Sugita, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspection apparatus for inspecting a microarray comprises an image sensor for imaging the microarray, a moving means for moving the image sensor relative to the microarray, a memory for memorizing the position of a defective picture element on the image sensor, and a controlling means which determines an overlap state of an imaging area of the defective picture element on reaction areas on the microarray and controls the moving means based on the result of the determination.