The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Oct. 18, 2006
Marc Marini, New Braunfels, TX (US);
Nicolas Vazquez, Austin, TX (US);
Marc Marini, New Braunfels, TX (US);
Nicolas Vazquez, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A machine vision development environment that may utilize a control flow representation (preferably a state diagram representation) to specify and execute machine vision routines (e.g., sometimes referred to as inspection routines). A user may first create one or more machine vision routines using any of various methods. The user may then graphically specify a sequence of machine vision steps or operations, e.g., a machine vision inspection, using a state diagram representation. The state diagram representation may comprise a plurality of icons which represent states with corresponding operations or functions, such as, for example, Load Inspection, Part Ready, Run Inspection, Read Digital Input, etc. The various icons may be connected by wires that indicate control flow transitions, e.g., state transitions, among the states. The state diagram may then be executed to control the machine vision routines.