The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Oct. 07, 2009
Shuenn-yuh Lee, Minxiong Shiang, TW;
Ming-chun Liang, Pingtung, TW;
Shuenn-Yuh Lee, Minxiong Shiang, TW;
Ming-Chun Liang, Pingtung, TW;
National Chung Cheng University, Chia-Yi, TW;
Abstract
The present invention discloses an FFT-based ADC calibration system able to solve the problems of capacitor mismatch and finite Op-Amp open loop gain, which result in that the radix of the gain of each stage is not exactly equal to 2. The present invention uses an FFT processor to calculate the real radix of each stage and uses a digital method to generate new digital outputs. As the present invention can compensate the finite gain of Op-Amp, the specification of Op-Amp is not so critical in designing ADC. Therefore, the low-gain Op-Amp can be used to reduce the power consumption of ADC. Further, the FFT-based calibration technology can considerably promote the performance of ADC.