The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Jul. 07, 2008
Sung Min Hong, Gyeonggi-do, KR;
Soon Sup Park, Gyeonggi-do, KR;
Yeon Hwa Kwak, Gyeonggi-do, KR;
Yeon Shik Choi, Gyeonggi-do, KR;
Han Young Lee, Gyeonggi-do, KR;
Hyung Man Lee, Gyeonggi-do, KR;
Sung Min Hong, Gyeonggi-do, KR;
Soon Sup Park, Gyeonggi-do, KR;
Yeon Hwa Kwak, Gyeonggi-do, KR;
Yeon Shik Choi, Gyeonggi-do, KR;
Han Young Lee, Gyeonggi-do, KR;
Hyung Man Lee, Gyeonggi-do, KR;
Abstract
The present invention relates to an apparatus for analyzing cells in real-time which incorporates a wavelength-tunable light source/infrared ray (IR) sensor and can be used to observe and analyze the IR-related characteristics of adherent cells or non-adherent cells. The Apparatus for analyzing cells in real-time in accordance with the present invention can be used to quantify specific materials in a cell and measure the metabolism of a cell. In addition, the apparatus for analyzing cells in real-time in accordance with the present invention can be configured to have a visible light microscope coupled thereto, and in this configuration, it can be used to locate a cell of interest.