The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Apr. 13, 2009
Applicants:

Michael V. Hynes, Cambridge, MA (US);

Bernard Harris, Waltham, MA (US);

Eugene E. Lednum, Bolton, MA (US);

Mark S. Wallace, Santa Fe, NM (US);

Larry J. Schultz, Los Alamos, NM (US);

David M. Palmer, Los Alamos, NM (US);

Daniel T. Wakeford, Pembroke, CA;

Hugh R. Andrews, Pembroke, CA;

Richard C. Lanza, Brookline, MA (US);

Edward T. H. Clifford, Deep River, CA;

Harry Ing, Deep River, CA;

Liqian LI, Deep River, CA;

Andrew Hoover, Los Alamos, NM (US);

Shawn R. Tornga, Los Alamos, NM (US);

Richard M. Kippen, Los Alamos, NM (US);

Inventors:

Michael V. Hynes, Cambridge, MA (US);

Bernard Harris, Waltham, MA (US);

Eugene E. Lednum, Bolton, MA (US);

Mark S. Wallace, Santa Fe, NM (US);

Larry J. Schultz, Los Alamos, NM (US);

David M. Palmer, Los Alamos, NM (US);

Daniel T. Wakeford, Pembroke, CA;

Hugh R. Andrews, Pembroke, CA;

Richard C. Lanza, Brookline, MA (US);

Edward T. H. Clifford, Deep River, CA;

Harry Ing, Deep River, CA;

Liqian Li, Deep River, CA;

Andrew Hoover, Los Alamos, NM (US);

Shawn R. Tornga, Los Alamos, NM (US);

Richard M. Kippen, Los Alamos, NM (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, generating image data includes receiving coded aperture imaging sensor data collected according to coded aperture imaging and receiving Compton imaging sensor data collected according to Compton imaging. The coded aperture imaging sensor data and the Compton imaging sensor data are generated by a sensor system sensing radiation from a radiation source. A coded aperture imaging pixel value and a Compton imaging pixel value are determined for each pixel of an image. A combining function comprising addition is applied to the coded aperture imaging pixel value and the Compton imaging pixel value to yield a combined pixel value for each pixel. Combined image data is generated from the combined pixel values. The combined image data is configured to yield a combined image of the radiation source.


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