The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Aug. 07, 2007
Applicants:
Wim Serruys, Gullegem, BE;
Johan DE Keuster, Heverlee (Ekeren), BE;
Joost Duflou, Leuven, BE;
Jean-pierre Kruth, Heverlee, BE;
Inventors:
Wim Serruys, Gullegem, BE;
Johan De Keuster, Heverlee (Ekeren), BE;
Joost Duflou, Leuven, BE;
Jean-Pierre Kruth, Heverlee, BE;
Assignee:
LVD Company NV, Gullegem, BE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to an arrangement () for the on-line monitoring of the quality of a laser process exerted on a workpiece (), comprising
Serruys, Wim. (2011). Arrangement and method for the on-line monitoring of the quality of a laser process exerted on a workpiece (U.S. Patent No. 7863544). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7863544
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile