The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Feb. 27, 2006
Toshihiko Fujikawa, Kawasaki, JP;
Mitsugu Usui, Yokohama, JP;
Toshihiko Fujikawa, Kawasaki, JP;
Mitsugu Usui, Yokohama, JP;
Eisai R&D Management Co., Ltd., Tokyo, JP;
Abstract
Provided are a method of detecting target genes capable of increasing sensitivity in a Palsar method and of simultaneously detecting multiple genes, an assist probe to be used in the above method, and a method of forming a signal probe polymer by using the assist probe. The method of detecting target genes includes: forming a signal probe polymer by using a first probe having a nucleic acid region X, a nucleic acid region Y and a nucleic acid region Z in the stated order from the 5' end, a second probe having a nucleic acid region X′, a nucleic acid region Y′ and a nucleic acid region Z′ in the stated order from the 5′ end, and an assist probe having a plurality of the same nucleic acid regions as in the first probe and a target region capable of hybridizing with a target gene. In this method, the assist probes are designed so as to have a structure including the nucleic acid regions X, Y and X, and the target region in the stated order from the 5′ end or a structure including the target region, and the nucleic acid regions Z, Y and Z in the stated order from the 5′ end.