The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Oct. 19, 2004
Applicant:

Yasuhito Murata, Kyoto, JP;

Inventor:

Yasuhito Murata, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a test piece supplying device () comprising a container () for containing a plurality of test pieces, and also includes a movable body () moving relative to the container () with the test piece accommodated in a recess () so as to take the test piece out of the container (). The container () includes a sweeping portion () for interfering with the test pieces, in the container (), located above the test piece accommodated in the recess (), when the movable body () moves relative to the container (). When a warped test piece accommodated in the recess () is moved relative to the container (), the interfering portion () flattens the test strip to be accommodated in the recess () so that the test piece is easily taken out of the container ().


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