The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Aug. 22, 2008
Applicants:

Alexander Dribinsky, Naperville, IL (US);

Gregory P. Pucci, Batavia, IL (US);

Yongyao Cai, Acton, MA (US);

Mathew Varghese, Arlington, MA (US);

Gary J. O'brien, Chandler, AZ (US);

Inventors:

Alexander Dribinsky, Naperville, IL (US);

Gregory P. Pucci, Batavia, IL (US);

Yongyao Cai, Acton, MA (US);

Mathew Varghese, Arlington, MA (US);

Gary J. O'Brien, Chandler, AZ (US);

Assignee:

Memsic, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, device, and method for minimizing x-axis and/or y-axis offset shift due to internally produced as well as externally produced on chip temperature imbalances. At least one temperature gradient canceling device is disposed on a substrate including a temperature gradient sensitive device having at least one pair of sensors. Voltage signals generated by the temperature gradient canceling devices can be combined with voltage signals generated by each of the pair of sensors to account for the offset.


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