The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2011

Filed:

Aug. 25, 2008
Applicants:

Tomoaki Yoshinaga, Yokohama, JP;

Shigeki Nagaya, Tokyo, JP;

Chiharu Sayama, Funabashi, JP;

Inventors:

Tomoaki Yoshinaga, Yokohama, JP;

Shigeki Nagaya, Tokyo, JP;

Chiharu Sayama, Funabashi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A face horizontal direction measuring unit measures the angle of the face horizontal direction for a face image obtained by an imaging unit. By using information on the radius of the head and information on the shoulder position of the person obtained by the aforementioned measurement, a face vertical displacement measuring unit measures a face displacement in the vertical direction not affected by a head posture. According to the obtained displacement, the face angle in the vertical direction is decided. By using the obtained face direction, the angle of the gaze in the horizontal direction and the eyeball radius are measured. Further, a gaze vertical displacement measuring unit is provided for which measuring the pupil center position against the eyeball center position as the gaze displacement in the vertical direction. This displacement amount is used to measure the gaze angle in the vertical direction.


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