The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Apr. 30, 2004
Applicants:

Timothy J. Knight, Shrewsbury, MA (US);

Darren J. Hayduk, Wilmington, MA (US);

David A. Choiniere, Attleborough, MA (US);

Venu G. Moogala, Marlborough, MA (US);

Mark E. Pawela, Hopkinton, MA (US);

Inventors:

Timothy J. Knight, Shrewsbury, MA (US);

Darren J. Hayduk, Wilmington, MA (US);

David A. Choiniere, Attleborough, MA (US);

Venu G. Moogala, Marlborough, MA (US);

Mark E. Pawela, Hopkinton, MA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus is provided for monitoring a variable of concern across multiple dynamic instances of a MIB object. The collection mechanism is associated with an interface that receives the executable command. The executable command is in an encoded format identifying one or more objects the collection mechanism is responsible for. This avoids the need to send multiple executable commands to a network device in order to monitor and evaluate the values of multiple variables across multiple MIB object instances.


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