The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Dec. 27, 2007
Applicants:

Daxin Huang, Shenzhen, CN;

Xing Shi, Shenzhen, CN;

Tianfeng Zhao, Shenzhen, CN;

Huan Qi, Shenzhen, CN;

Inventors:

Daxin Huang, Shenzhen, CN;

Xing Shi, Shenzhen, CN;

Tianfeng Zhao, Shenzhen, CN;

Huan Qi, Shenzhen, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A baseline processing device and method are provided for analyzing signals with uneven distributions of pulses and slow varying baselines. In one embodiment, the device includes an A/D sampling unit for sampling a digital counting signal to obtain sampled data, and a baseline extracting unit for sorting the N sampled data in the sampling sequence by magnitude and for outputting, among the N sample data, one sample data A with a value equal to the mid-value in the N sample data. A phase compensating unit with a width of M, to which a digital signal is input, outputs a sampled data B according to a FIFO sequence, wherein M=N/2. A first subtractor subtracts the sample data A from the sample data B and outputs the result as baseline removed data.


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