The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Sep. 13, 2005
Applicants:

Takanori Miyasaka, Fujisawa, JP;

Yasushi Mutoh, Fujisawa, JP;

Juntaro Sahara, Fujisawa, JP;

Inventors:

Takanori Miyasaka, Fujisawa, JP;

Yasushi Mutoh, Fujisawa, JP;

Juntaro Sahara, Fujisawa, JP;

Assignee:

NSK Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A abnormality diagnosing apparatus used in a machine equipment including a rotating or sliding part relative to a stationary member includes a detecting portionfixed to the rotating or sliding part or the stationary member and including a vibration sensorand a temperature sensor, and a signal processing portionfor determining a state of the part from a detecting signal outputted by the detecting portion. The signal processing portiondetermines presence or absence of a abnormality, or presence or absence of the abnormality and a degree of a damage of the part based on a combination of a measured result by the vibration sensorand a measured result by the temperature sensor


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