The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
May. 09, 2007
Kazuto Kojitani, Osaka, JP;
Hiroshi Tasaki, Kyoto, JP;
Hiroshi Nakajima, Kyoto, JP;
Seiko Ito, Nara, JP;
Kazuto Kojitani, Osaka, JP;
Hiroshi Tasaki, Kyoto, JP;
Hiroshi Nakajima, Kyoto, JP;
Seiko Ito, Nara, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile