The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Aug. 18, 2005
Samuli Siltanen, Helsinki, FI;
Martti Kalke, Tuusula, FI;
Henri Setälä, Järvenpää, FI;
Esa Suuronen, Kerava, FI;
Samuli Siltanen, Helsinki, FI;
Martti Kalke, Tuusula, FI;
Henri Setälä, Järvenpää, FI;
Esa Suuronen, Kerava, FI;
PaloDEx Group Oy, , FI;
Abstract
The invention relates to a method and system for determining a sharp panoramic image constructed from a group of projection images, especially the invention relates to defining a structure of the panoramic X-ray image of an area of a dentition and of jaws. The structure of a panoramic image to be generated from a group of projection images is determined by at least two crucial parameters, namely parameters of the central surface S of the sharp layer and thickness t(s) of the sharp layer, using penalty function F(S,t), which is at least a penalty function F(S,t) of low-frequency changes in the computed panoramic image corresponding to the choices S and t(S). After computing F(S,t) the best center surface and thickness function (in other words the sharpest layer of the panoramic image) is obtained by minimizing said penalty function F(S,t) over parameter space.