The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Oct. 17, 2006
Robert Wilhelm, Brannenburg, DE;
Juni Sun, Raubling, DE;
Rainer Huber, Piding, DE;
Marcus Steinbichler, Neubeuern, DE;
Volker Rasenberger, Raubling, DE;
Robert Wilhelm, Brannenburg, DE;
Juni Sun, Raubling, DE;
Rainer Huber, Piding, DE;
Marcus Steinbichler, Neubeuern, DE;
Volker Rasenberger, Raubling, DE;
Steinbichler Optotechnik GmbH, Neubeuern, DE;
Abstract
In a method for detecting the deformation of objects (), a sequence of pictures of the object () is taken with a measurement method during the deformation of the object (). From the pictures, phase images are determined. To improve such method, there is formed the difference between the current phase image or the respective current phase image and the phase image of an initial state. This difference or these differences is/are evaluated and/or displayed on a visual display unit and/or stored.