The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Jun. 28, 2010
Applicant:

Martin Annis, Cambridge, MA (US);

Inventor:

Martin Annis, Cambridge, MA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of producing a laminography image of an object. The object is rotated on a platform in an object space between a fixed x-ray source and multiple columns of detector elements. Two samples of each voxel are taken at each detector column, one for each of the two alignments of the x-ray source, voxel, and detector column as the object rotates. It is generally possible to image the entire object in one rotation. Optionally, the platform axis can be offset from the system center line or the platform can be translated through the object space in the plane of the platform in order to make sure that each voxel traverses all of the detector columns to acquire maximum data. Once all of the data for all of the voxels is acquired, it is used with any appropriate laminography algorithm to produce images of the object.


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