The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Mar. 21, 2007
Galen E. Stansell, Kirkland, WA (US);
Galen E. Stansell, Kirkland, WA (US);
Cypress Semiconductor Corporation, San Jose, CA (US);
Abstract
A programmable latch circuit () can include a volatile latch () that may regenerate a value determined by programmable section (). In a test operation, a variable current source (') can generate a current (IBASE) that can be mirrored in test sections (-and-) and compared to a current drawn by either programmable element (-) or (-) by a latching operation of volatile latch (). Variable current source (′) can enable characterization of programmable elements (-or-) as well as adjustable test threshold limits. A program voltage (Vprog) applied to programmable elements (-or-) can be also be variable to allow for characterization of programmable elements (-and-) over a range of voltages.