The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Dec. 03, 2007
Tsuyoshi Eiza, Osaka, JP;
Shinya Shimizu, Osaka, JP;
Tsuyoshi Eiza, Osaka, JP;
Shinya Shimizu, Osaka, JP;
Funai Electric Co., Ltd., Osaka, JP;
Abstract
An aberration correction apparatus comprising a liquid crystal device which includes a first electrode layer that is formed with regions divided concentrically, a second electrode layer that is formed with regions divided concentrically, and a liquid crystal that is sandwiched in between the first electrode layer and the second electrode layer, and which transmits an incident light beam therethrough, an objective lens which condenses the light beam transmitted through the liquid crystal device, and a liquid-crystal-device drive circuit which drives the liquid crystal device, wherein the liquid-crystal-device drive circuit impresses a potential which belongs to a predetermined region included in a liquid crystal characteristic that is a relationship between potentials impressed on the respective electrode layers sandwiching in the liquid crystal therebetween and a phase change magnitude of the light beam transmitted through the liquid crystal, on the concentric regions formed in the first electrode layer, and it impresses a potential which belongs to a region included in the liquid crystal characteristic and exhibiting a smaller phase change magnitude per unit drive voltage than in the predetermined region, on the concentric regions formed in the second electrode layer, whereby an aberration of the light beam is corrected.