The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Sep. 26, 2006
Applicants:

Igor Borodin, Netanya, IL;

Elad Ganot, Givatayim, IL;

Ami Heitner, Netanya, IL;

David Rachamim, Kfar HaNagid, IL;

Ben F. D. Shaibe, Even-Yehuda, IL;

Penina Weiss, Givat Shmuel, IL;

Inventors:

Igor Borodin, Netanya, IL;

Elad Ganot, Givatayim, IL;

Ami Heitner, Netanya, IL;

David Rachamim, Kfar HaNagid, IL;

Ben F. D. Shaibe, Even-Yehuda, IL;

Penina Weiss, Givat Shmuel, IL;

Assignee:

SAP Portals Israel Ltd., Ra'anana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for providing information about a model of a test for an application, using an application model, the method comprising the steps of: providing a pre configuration of the application or a part thereof; providing a transformation parameter; and providing an at least one post configuration of the at least one application or a part thereof. Once the pre-configuration, transformation parameter of post-configuration are provide, a test description is generated, which can then be compiled to suit and testing tool or environment.


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