The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Jan. 29, 2008
Applicants:
Tomoyoshi Abe, Tokyo, JP;
Takefumi Hayashi, Tokyo, JP;
Hiroaki Okada, Tokyo, JP;
Inventors:
Assignee:
Kabushiki Kaisha Topcon, Itabashi-Ku, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical image measuring device forms an image of an object to be measured based on a result of light-receiving by a light-receiving part. This optical image measuring device comprises: a specifying part configured to specify the light irradiated state to the light-receiving surface of a light-receiving part via a light guiding part and a dispersion part; and an altering part configured to alter the relative position and/or direction between a light-receiving surface and the exit end of light from the light guiding part, based on the light irradiated state.