The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Jul. 02, 2007
Applicants:
Gunter Moehler, Jena, DE;
Dietmar Schmidt, Bibra, DE;
Mirko Liedtke, Jena, JP;
Inventors:
Assignee:
Carl Zeiss MicroImaging GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01); H03K 19/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for detecting and analyzing light signals, in which a light signal impinges an optoelectric converter, where it is converted into an electric signal and the electric signal subsequent to the conversion is distributed into several analysis channels (-), within each analysis channel (), (i) a signal analysis is performed, which is different from the signal analysis for the other analysis channels (-) and (ii) an output signal is created. In such a method, one or more output signals are selected for further processing and output using a specified, changeable selection criterion.