The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Dec. 15, 2005
Applicants:

John F. Shakespeare, Kuopio, FI;

Tarja T. Shakespeare, Kuopio, FI;

Inventors:

John F. Shakespeare, Kuopio, FI;

Tarja T. Shakespeare, Kuopio, FI;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes generating at least one first light beam and generating at least one second light beam and at least one third light beam using the at least one first light beam. The at least one first light beam has a plurality of first regions, the at least one second light beam has a plurality of second regions, and the at least one third light beam has a plurality of third regions. Each of the first, second, and third light beams has at least two regions that are spectrally different. The method also includes measuring a spectrum in each of a plurality of first wavelength bands for each of the second regions. The method further includes illuminating at least part of an object with the at least one third light beam to produce at least one fourth light beam. The at least one fourth light beam has a plurality of fourth regions, where at least two of the fourth regions are spectrally different. In addition, the method includes measuring a spectrum in each of a plurality of second wavelength bands for each of the fourth regions and identifying a radiance transfer factor of the object using at least some of the measured spectra.


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